The problem of detecting defective turned-off elements in antenna arrays from near-field measurements is addressed. In particular, the focus here is to reduce the number of measurements in order to positively affect the acquisition time. Such an issue is achieved by adopting the recently developed warping sampling method. Two commonly antenna diagnostics methods, i.e, the Back Transformation Method (BTM) and the Matrix Method (MM), are considered in view of this new sampling strategy and compared to the usual half-wavelength sampling. In particular, in order to identify the fault locations, outcomes returned by BTM and MM undergo a detection step based on a cell-averaging CFAR (CA)-CFAR technique borrowed from the radar literature. It is shown that the warping sampling method provides performance close to the uniform half-wavelength one with a reduced number of data. Numerical simulations are carried out in order to verify the results with different fault layouts and tapered currents.

Non-Uniform Warping Sampling for Data Reduction in Planar Array Diagnostics

Maisto M. A.;Leone G.;Pierri R.;Solimene R.
2022

Abstract

The problem of detecting defective turned-off elements in antenna arrays from near-field measurements is addressed. In particular, the focus here is to reduce the number of measurements in order to positively affect the acquisition time. Such an issue is achieved by adopting the recently developed warping sampling method. Two commonly antenna diagnostics methods, i.e, the Back Transformation Method (BTM) and the Matrix Method (MM), are considered in view of this new sampling strategy and compared to the usual half-wavelength sampling. In particular, in order to identify the fault locations, outcomes returned by BTM and MM undergo a detection step based on a cell-averaging CFAR (CA)-CFAR technique borrowed from the radar literature. It is shown that the warping sampling method provides performance close to the uniform half-wavelength one with a reduced number of data. Numerical simulations are carried out in order to verify the results with different fault layouts and tapered currents.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11591/482808
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