Ag X-ray fluorescence on different thickness and concentration layers

This work derives from the requirement to investigate on the silver surface enrichment of objects of historical and artistic interest using the X-ray fluorescence non-destructive technique (XRF). The aim is the thickness estimation through the experimental relationship between K-alpha/K-beta and K-alpha/L-alpha of Ag as a function of the thickness. Measurements on silver sheets of different thicknesses and three concentrations are carried out using a XRF spectrometer with a maximum voltage of 50 kV. The results allow to analyse the plating layer of silver objects also to make other interesting considerations.