(110) MgO thin films have been deposited by RF sputtering on (110) SrTiO3 and used as buffer layers for YBCO deposition. The MgO films show high morphological quality, as confirmed by X-ray specular reflectivity, and narrow (approximate to 1 degrees) X-ray diffraction peaks in the rocking curves measurements. These results are discussed in the framework of an ionic oxide growth model. XRD analyses performed on the bilayer YBCO/MgO (110) confirm the epitaxial growth of the films. with cool) YBCO//(110) MgO. XRD, AFM, SEM measurements are compared with data relative to bilayers deposited on (100) SrTiO3.

Structure and morphology of MgO/YBaCuO bilayers for biepitaxial junctions

TAFURI, Francesco;
1996

Abstract

(110) MgO thin films have been deposited by RF sputtering on (110) SrTiO3 and used as buffer layers for YBCO deposition. The MgO films show high morphological quality, as confirmed by X-ray specular reflectivity, and narrow (approximate to 1 degrees) X-ray diffraction peaks in the rocking curves measurements. These results are discussed in the framework of an ionic oxide growth model. XRD analyses performed on the bilayer YBCO/MgO (110) confirm the epitaxial growth of the films. with cool) YBCO//(110) MgO. XRD, AFM, SEM measurements are compared with data relative to bilayers deposited on (100) SrTiO3.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11591/232345
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 12
  • ???jsp.display-item.citation.isi??? 11
social impact