An ECT data analysis environment has been developed, able to effectively deal with measurement taken at different scanning frequencies, in order determine defect position and shape. The system performance is proved against a benchmark problem (JSAEM #2). The use of multiple frequencies scanning improves the ability to discriminate flaw depths in conducting materials. The described environment suitably combines a cluster multiprocessors machine and a parallel Genetic Algorithm inverse solver.
Analysis of Concurrent Multi-Frequency Eddy Current Testing Data
FORMISANO, Alessandro;MARTONE, Raffaele
2006
Abstract
An ECT data analysis environment has been developed, able to effectively deal with measurement taken at different scanning frequencies, in order determine defect position and shape. The system performance is proved against a benchmark problem (JSAEM #2). The use of multiple frequencies scanning improves the ability to discriminate flaw depths in conducting materials. The described environment suitably combines a cluster multiprocessors machine and a parallel Genetic Algorithm inverse solver.File in questo prodotto:
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