In this paper, a one dimensional inverse profiling problem under a linearised framework is addressed. The aim is to establish the role played by a reflecting plane located in the scattering scenario on the profile reconstructions by studying its impact on the singular values of the scattering operator. It is shown that in presence of reflecting plane, the singular values exhibit a step-like behavior and the Number of Degree of Freedom (NDF) is twice as large as the NDF in homogeneous medium. This entails an enlargement of the class of dielectric profiles that can be reliably reconstructed.

Linear One-dimensional Inverse Profiling: The Role of a Reflecting Plane in the Background

Maisto M. A.;Solimene R.
2024

Abstract

In this paper, a one dimensional inverse profiling problem under a linearised framework is addressed. The aim is to establish the role played by a reflecting plane located in the scattering scenario on the profile reconstructions by studying its impact on the singular values of the scattering operator. It is shown that in presence of reflecting plane, the singular values exhibit a step-like behavior and the Number of Degree of Freedom (NDF) is twice as large as the NDF in homogeneous medium. This entails an enlargement of the class of dielectric profiles that can be reliably reconstructed.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11591/556297
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